Proceedings of the 3rd International Conference on Mechatronics, Robotics and Automation

Eliminate the X-Optimization during RTL Verification

Authors
Xu Huang, He Xin, Lintao Liu, Luncai Liu
Corresponding Author
Xu Huang
Available Online April 2015.
DOI
https://doi.org/10.2991/icmra-15.2015.75How to use a DOI?
Keywords
X-Optimization;Verification
Abstract
Verification of complex SoC designs suffers from X-optimization issues that often conceal design bugs. The deployment of low power techniques such as power-shutdown in today’s SoC designs exacerbate these X-optimism issues. To address these problems we adopted a new simulation semantic that more accurately models non-deterministic values in logic simulation. In this paper we discuss how to eliminate the X-optimism during RTL verification.
Open Access
This is an open access article distributed under the CC BY-NC license.

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Proceedings
3rd International Conference on Mechatronics, Robotics and Automation
Part of series
Advances in Computer Science Research
Publication Date
April 2015
ISBN
978-94-62520-76-9
ISSN
2352-538X
DOI
https://doi.org/10.2991/icmra-15.2015.75How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Xu Huang
AU  - He Xin
AU  - Lintao Liu
AU  - Luncai Liu
PY  - 2015/04
DA  - 2015/04
TI  - Eliminate the X-Optimization during RTL Verification
BT  - 3rd International Conference on Mechatronics, Robotics and Automation
PB  - Atlantis Press
SP  - 381
EP  - 385
SN  - 2352-538X
UR  - https://doi.org/10.2991/icmra-15.2015.75
DO  - https://doi.org/10.2991/icmra-15.2015.75
ID  - Huang2015/04
ER  -