Proceedings of the 3rd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2017)

A Method for Improving the Attitude Calculation's Fault Tolerance Rate by Using Hardware + Software

Authors
Hong ZHAI, Xing-Qian LI, Ling-Yu CHEN, Yun-Long ZHU, Hong-Wei ZHAO
Corresponding Author
Hong ZHAI
Available Online September 2017.
DOI
10.2991/eeeis-17.2017.68How to use a DOI?
Keywords
Attitude calculation, result verification, hardware + software, fault tolerance, MPU6050.
Abstract

Abstract: the UAV attitude calculation is an important technique in UAC's technology, many other teches are dependent on it, read the sensor's signal, and calculate after trans is the main method of UAV attitude solution by now, but this kind of method use the software method to calculate in general. If error, no way to correct. This paper uses hardware + software way for attitudes calculate. And checking the results, improve the tolerance of attitude's solution. Enhance the correct attitude calculation results.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 3rd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2017)
Series
Advances in Engineering Research
Publication Date
September 2017
ISBN
978-94-6252-400-2
ISSN
2352-5401
DOI
10.2991/eeeis-17.2017.68How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Hong ZHAI
AU  - Xing-Qian LI
AU  - Ling-Yu CHEN
AU  - Yun-Long ZHU
AU  - Hong-Wei ZHAO
PY  - 2017/09
DA  - 2017/09
TI  - A Method for Improving the Attitude Calculation's Fault Tolerance Rate by Using Hardware + Software
BT  - Proceedings of the 3rd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2017)
PB  - Atlantis Press
SP  - 467
EP  - 472
SN  - 2352-5401
UR  - https://doi.org/10.2991/eeeis-17.2017.68
DO  - 10.2991/eeeis-17.2017.68
ID  - ZHAI2017/09
ER  -