Proceedings of the 3rd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2017)

Bio-speckle Method for Garden Pea Seed Nondestructive Classification

Authors
Yong-Zhen KANG, Ying-Qi ZHAO, Lin SHAO, Lei YAN, Jiang XIAO
Corresponding Author
Yong-Zhen KANG
Available Online September 2017.
DOI
10.2991/eeeis-17.2017.66How to use a DOI?
Keywords
bio-speckle, laser light, seed viability, GD, nondestructive technique
Abstract

Abstract.Bio-speckle is a non-destructive method applied widely in detection of seed viability.This paper explored the application of the Generalized Difference Method(GD),a bio-speckle image processing algorithm,in classifying garden pea seed viability quantitatively and qualitatively.The experiment was conducted for recording the gray-scale images of the bio-speckle images obtained by illuminating the active materials with laser light.The GD value calculated by THSP figure could depict the tendency of the seed viability.The experiments prove that the method can effectively improve the classification results of garden pea seed obtained by aging chamber at different levels.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 3rd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2017)
Series
Advances in Engineering Research
Publication Date
September 2017
ISBN
10.2991/eeeis-17.2017.66
ISSN
2352-5401
DOI
10.2991/eeeis-17.2017.66How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Yong-Zhen KANG
AU  - Ying-Qi ZHAO
AU  - Lin SHAO
AU  - Lei YAN
AU  - Jiang XIAO
PY  - 2017/09
DA  - 2017/09
TI  - Bio-speckle Method for Garden Pea Seed Nondestructive Classification
BT  - Proceedings of the 3rd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2017)
PB  - Atlantis Press
SP  - 458
EP  - 462
SN  - 2352-5401
UR  - https://doi.org/10.2991/eeeis-17.2017.66
DO  - 10.2991/eeeis-17.2017.66
ID  - KANG2017/09
ER  -