The Research on Power Grid Self-Healing in a High-Voltage Smart Grid

DOI

10.2991/eeeis-17.2017.24How to use a DOI?

Keywords

Smart Grid, Fault Identification, Video Technology, Self-Healing Grid, Tuning Control, Self-Prevention

Abstract

In this paper, a concept of self-healing of high-voltage power grids and their research status are first introduced. Based on that, a new high-voltage power grid self-healing scheme is proposed. The collections of protective trip information, i.e. action set of each fault point, are initially utilized to establish an expert knowledge base in advance. When a fault happens, the action set will be formed according to the action information of breakers and protections gathered by a power grid control center. Then, it will be compared and contrasted with the action set in the expert knowledge base to determine the fault point. A 220kV smart grid control center in east China grid with a fault on its high-voltage power grid is taken as an example. The idea of high-voltage power grid self-healing is put forward, and the issues that need attention are summarized for prevention and tuning control during the self-healing process. The process of employing the expert knowledge base to identify the fault point, fault isolation and power grid restoration, are presented and then testified with the results from video technologies. The example shows that the proposed scheme can meet the requirement of self-healing for grids. It can isolate a fault automatically and quickly, and then restore the non-fault part. This proposed approach can fulfill as a good reference for the construction of smart grids at the moment.

Copyright

© 2017, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Guang-Liang YANG
AU  - Jing ZHOU
AU  - Yong WANG
PY  - 2017/09
DA  - 2017/09
TI  - The Research on Power Grid Self-Healing in a High-Voltage Smart Grid
BT  - Proceedings of the 3rd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2017)
PB  - Atlantis Press
SP  - 164
EP  - 171
SN  - 2352-5401
UR  - https://doi.org/10.2991/eeeis-17.2017.24
DO  - 10.2991/eeeis-17.2017.24
ID  - YANG2017/09
ER  -