A Sequential Circuits Test Set Generation Method Based on Ant Colony Particle Swarmalgorithm
Xin Fu, Shuai Fu
Available Online November 2012.
- https://doi.org/10.2991/citcs.2012.58How to use a DOI?
- Test set generation, Ant colony algorithm, Particle swarm algorithm,Timing circuit
- There exists a lot of trigger unit in Timing circuit, and this leads to high computational complexity in its initialization and test set generation for deterministic method. This paper presents a timing circuit initialization and test set generation method. In the proposed method, a particle swarm algorithm is used to initialize the sequential circuits, and correlation matrix of the circuit is transformed into a graph, and finally ant colony algorithm is used to generate the corresponding test set. In the contrast experiments, it is demonstrated that the generated test set is able to complete the initialization and fault detection for the ISCAS' 89 benchmark timing circuit, and the coverage rate of production meets the actual demand, and the iteration times and execution time shows obvious advantages.
- Open Access
- This is an open access article distributed under the CC BY-NC license.
Cite this article
TY - CONF AU - Xin Fu AU - Shuai Fu PY - 2012/11 DA - 2012/11 TI - A Sequential Circuits Test Set Generation Method Based on Ant Colony Particle Swarmalgorithm BT - 2012 National Conference on Information Technology and Computer Science PB - Atlantis Press SP - 216 EP - 220 SN - 1951-6851 UR - https://doi.org/10.2991/citcs.2012.58 DO - https://doi.org/10.2991/citcs.2012.58 ID - Fu2012/11 ER -