A Sequential Circuits Test Set Generation Method Based on Ant Colony Particle Swarmalgorithm

DOI

10.2991/citcs.2012.58How to use a DOI?

Keywords

Test set generation, Ant colony algorithm, Particle swarm algorithm,Timing circuit

Abstract

There exists a lot of trigger unit in Timing circuit, and this leads to high computational complexity in its initialization and test set generation for deterministic method. This paper presents a timing circuit initialization and test set generation method. In the proposed method, a particle swarm algorithm is used to initialize the sequential circuits, and correlation matrix of the circuit is transformed into a graph, and finally ant colony algorithm is used to generate the corresponding test set. In the contrast experiments, it is demonstrated that the generated test set is able to complete the initialization and fault detection for the ISCAS' 89 benchmark timing circuit, and the coverage rate of production meets the actual demand, and the iteration times and execution time shows obvious advantages.

Copyright

© 2012, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Xin Fu
AU  - Shuai Fu
PY  - 2012/11
DA  - 2012/11
TI  - A Sequential Circuits Test Set Generation Method Based on Ant Colony Particle Swarmalgorithm
BT  - Proceedings of the 2012 National Conference on Information Technology and Computer Science
PB  - Atlantis Press
SP  - 216
EP  - 220
SN  - 1951-6851
UR  - https://doi.org/10.2991/citcs.2012.58
DO  - 10.2991/citcs.2012.58
ID  - Fu2012/11
ER  -