The X-ray Radiation Response of CdZnTe Crystal Nuclear Detector

DOI

10.2991/itms-15.2015.317How to use a DOI?

Keywords

CdZnTe; radiation response; radiation damage;

Abstract

The X-ray radiation response and radiation damage of CdZnTe (CZT) detector were studied in this paper. After rapid temperature annealing, the linearity of I-V curve was much better than before. Photo current of Au/CZT planar detector increased linearly with the X-ray intensity. An inflection point around 10-30 V was observed for different X-ray intensity. Below the inflection points, with the increase of applied voltage, photon current increased linearly, while the current still increased after the inflection point likely due to the illumination-related impact ionization effect. In addition, under exposure in strong X-ray intensity, the photo current remains unchanged before the inflection point while it changes significantly with after the inflection point.

Copyright

© 2015, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - X.Y. Dai
AU  - H. Meng
AU  - Y.L. Zhang
AU  - J. Tao
AU  - R. Xu
AU  - J.J. Zhang
AU  - J. Huang
AU  - L. Wang
AU  - K. Tang
AU  - J.H. Min
AU  - L.J. Wang
PY  - 2015/11
DA  - 2015/11
TI  - The X-ray Radiation Response of CdZnTe Crystal Nuclear Detector
BT  - Proceedings of the 2015 International Conference on Industrial Technology and Management Science
PB  - Atlantis Press
SP  - 1296
EP  - 1299
SN  - 2352-538X
UR  - https://doi.org/10.2991/itms-15.2015.317
DO  - 10.2991/itms-15.2015.317
ID  - Dai2015/11
ER  -