Proceedings of the 2015 International Conference on Industrial Technology and Management Science

High-speed Target Recognition Algorithm and Simulation

Authors
Shuai Duan, Jiahao Deng
Corresponding Author
Shuai Duan
Available Online November 2015.
DOI
10.2991/itms-15.2015.177How to use a DOI?
Keywords
` quasi-electrostatic field; high-speed target recognition; capacitance detector; algorithm
Abstract

The purpose of this paper is devoted to finding a method to recognize the high-speed target for missile in a certain distance. Based on the quasi-electrostatic field characteristics of the capacitance detector, this paper analyzed the output voltage of detection circuit from a capacitance detector. It can be found that, when a high-speed target getting close to the detector, the output voltage of detection circuit changes with certain rules. Our research applied a low-speed static test to obtain the static characteristic data of the target, proposed a high-speed target recognition algorithm and set threshold values based on starting voltage, second derivative and signal duration. The result showed that the algorithm is effective to recognize high-speed missile target.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Industrial Technology and Management Science
Series
Advances in Computer Science Research
Publication Date
November 2015
ISBN
10.2991/itms-15.2015.177
ISSN
2352-538X
DOI
10.2991/itms-15.2015.177How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Shuai Duan
AU  - Jiahao Deng
PY  - 2015/11
DA  - 2015/11
TI  - High-speed Target Recognition Algorithm and Simulation
BT  - Proceedings of the 2015 International Conference on Industrial Technology and Management Science
PB  - Atlantis Press
SP  - 749
EP  - 752
SN  - 2352-538X
UR  - https://doi.org/10.2991/itms-15.2015.177
DO  - 10.2991/itms-15.2015.177
ID  - Duan2015/11
ER  -