Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference

A Method of Obtaining ASIC Schematic Using Scan Chain

Authors
Xiaoming Chen, Yang Liu, Songsong Li
Corresponding Author
Xiaoming Chen
Available Online March 2015.
DOI
10.2991/iiicec-15.2015.220How to use a DOI?
Keywords
Trojan detection; Scan chain; Truth table; Schematic
Abstract

Hardware Trojan is easy to be embedded during IC’s design and manufacturing. Mostly used Trojan detection technique based on side-channel approach need a Trojan-free instance, and could not ensure Trojan-free instance’s consistent of schematic. With the help of scan chain, one of the widely used design for testability (DFT) technology, a novel approach is proposed to obtain the schematic of Application Specific Integrated Circuit (ASIC). It is verified and tested by formal verification and hardware simulation. This approach not only could help to obtain the Trojan-free instance which has the same schematic as the ordinary design, but also provide a new method to other Hardware Trojan detection techniques.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference
Series
Advances in Computer Science Research
Publication Date
March 2015
ISBN
978-94-62520-54-7
ISSN
2352-538X
DOI
10.2991/iiicec-15.2015.220How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Xiaoming Chen
AU  - Yang Liu
AU  - Songsong Li
PY  - 2015/03
DA  - 2015/03
TI  - A Method of Obtaining ASIC Schematic Using Scan Chain
BT  - Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference
PB  - Atlantis Press
SP  - 985
EP  - 990
SN  - 2352-538X
UR  - https://doi.org/10.2991/iiicec-15.2015.220
DO  - 10.2991/iiicec-15.2015.220
ID  - Chen2015/03
ER  -