Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference

2015 International Industrial Informatics and Computer Engineering Conference

📍Xi'an, China🗓️ 10-11 January 2015

High Temperature Baking Test System Design and Implementation

Authors
Liang Lu, Hong Ma, Yupeng Hu
Corresponding Author
Liang Lu
Available Online March 2015.
DOI
10.2991/iiicec-15.2015.136How to use a DOI?
Keywords
Bonfire Environment; Baking Test; Auto-tuning PID Regulator
Abstract

To simulate the unexpected bonfire environment during weapon’s life time, a high temperature baking test system is established. It chooses the high-temperature furnaces as heating terminal, develops a heat control instrument and programs the computer monitoring software. Considering the problems of the high temperature control, such as time-variant parameters, nonlinear and large time delay, a auto-tuning PID regulator is established. The heat terminal,monitoring software and auto-tuning PID regulator constitute the baking test system which could simulate bonfire environment with the heating range up to 700 and heating rate up to 200 /min. The experimental verification demonstrates that the results show the system meets the requirements of temperature control and could be used for the unexpected bonfire environment.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference
Series
Advances in Computer Science Research
Publication Date
March 2015
ISBN
978-94-62520-54-7
ISSN
2352-538X
DOI
10.2991/iiicec-15.2015.136How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Liang Lu
AU  - Hong Ma
AU  - Yupeng Hu
PY  - 2015/03
DA  - 2015/03
TI  - High Temperature Baking Test System Design and Implementation
BT  - Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference
PB  - Atlantis Press
SP  - 594
EP  - 599
SN  - 2352-538X
UR  - https://doi.org/10.2991/iiicec-15.2015.136
DO  - 10.2991/iiicec-15.2015.136
ID  - Lu2015/03
ER  -