Proceedings of the 3rd International Conference on Mechatronics, Robotics and Automation

An supervised learning method for overlapping cells

Authors
Pengfei Shen, Jie Yang
Corresponding Author
Pengfei Shen
Available Online April 2015.
DOI
https://doi.org/10.2991/icmra-15.2015.207How to use a DOI?
Keywords
overlapping; non-rigid registration; over-segmentation; template matching
Abstract
The clustering phenomenon often appears in histopathology image, some cells overlap or touch together to from a big area. It is necessary to design an effective algorithm to separate the clustering cells into single one. We describe a generic method for segmentation microscopy images based on supervised modeling. The main idea is to use the example input segmentations to learn a statistical model of the shape and texture of the structures to be segmented. The segmentation of the test image can be functioned by maximizing the normalized cross correlation between the model and neighborhoods in the test image, accompanied by a final adjustment that utilizes nonrigid registration. This method can effectively and efficiently solve the overlapping and over-segmentation problem.
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This is an open access article distributed under the CC BY-NC license.

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Volume Title
Proceedings of the 3rd International Conference on Mechatronics, Robotics and Automation
Series
Advances in Computer Science Research
Publication Date
April 2015
ISBN
978-94-62520-76-9
ISSN
2352-538X
DOI
https://doi.org/10.2991/icmra-15.2015.207How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Pengfei Shen
AU  - Jie Yang
PY  - 2015/04
DA  - 2015/04
TI  - An supervised learning method for overlapping cells
BT  - Proceedings of the 3rd International Conference on Mechatronics, Robotics and Automation
PB  - Atlantis Press
SP  - 1071
EP  - 1075
SN  - 2352-538X
UR  - https://doi.org/10.2991/icmra-15.2015.207
DO  - https://doi.org/10.2991/icmra-15.2015.207
ID  - Shen2015/04
ER  -