Research of Integrated Test System of Potentiometer Electric Parameter Based on Multi-CPU Control
- https://doi.org/10.2991/emim-15.2015.57How to use a DOI?
- Potentiometer; Integrated Test System; Multi-CPU; STC Microcontroller
The problems of low testing efficiency and high testing cost exist in small and medium potentiometer enterprises when multi-station and multi-instrument are used to respectively test potentiometer electric parameters. The paper propose a designing project based on the integrated test system of multi-CPU , analyzes the working principle of the system and introduces in detail the software and hardware design. The result of the experiment indicates that this system not only enjoys high test precision and fast speed, but also reduces effectively the testing cost.
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Jingping Yuan AU - Xiaorong Zhao AU - Fenfen Yu PY - 2015/04 DA - 2015/04 TI - Research of Integrated Test System of Potentiometer Electric Parameter Based on Multi-CPU Control BT - Proceedings of the 2015 International Conference on Education, Management, Information and Medicine PB - Atlantis Press SP - 293 EP - 297 SN - 2352-5428 UR - https://doi.org/10.2991/emim-15.2015.57 DO - https://doi.org/10.2991/emim-15.2015.57 ID - Yuan2015/04 ER -