Proceedings of the 2015 International Conference on Education, Management, Information and Medicine

Research of Integrated Test System of Potentiometer Electric Parameter Based on Multi-CPU Control

Authors
Jingping Yuan, Xiaorong Zhao, Fenfen Yu
Corresponding Author
Jingping Yuan
Available Online April 2015.
DOI
https://doi.org/10.2991/emim-15.2015.57How to use a DOI?
Keywords
Potentiometer; Integrated Test System; Multi-CPU; STC Microcontroller
Abstract

The problems of low testing efficiency and high testing cost exist in small and medium potentiometer enterprises when multi-station and multi-instrument are used to respectively test potentiometer electric parameters. The paper propose a designing project based on the integrated test system of multi-CPU , analyzes the working principle of the system and introduces in detail the software and hardware design. The result of the experiment indicates that this system not only enjoys high test precision and fast speed, but also reduces effectively the testing cost.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Education, Management, Information and Medicine
Series
Advances in Economics, Business and Management Research
Publication Date
April 2015
ISBN
978-94-62520-68-4
ISSN
2352-5428
DOI
https://doi.org/10.2991/emim-15.2015.57How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Jingping Yuan
AU  - Xiaorong Zhao
AU  - Fenfen Yu
PY  - 2015/04
DA  - 2015/04
TI  - Research of Integrated Test System of Potentiometer Electric Parameter Based on Multi-CPU Control
BT  - Proceedings of the 2015 International Conference on Education, Management, Information and Medicine
PB  - Atlantis Press
SP  - 293
EP  - 297
SN  - 2352-5428
UR  - https://doi.org/10.2991/emim-15.2015.57
DO  - https://doi.org/10.2991/emim-15.2015.57
ID  - Yuan2015/04
ER  -