Proceedings of the 3rd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2017)

The Method for Discovering Technology Competitor Groups Based on Graph Clustering

Authors
Yong-Sheng YU, Hong-Qi HAN, Zhong LI
Corresponding Author
Yong-Sheng YU
Available Online September 2017.
DOI
10.2991/eeeis-17.2017.71How to use a DOI?
Keywords
Term extraction, technology competitor groups, clustering analysis.
Abstract

For enterprise decision-makers, it is crucial to timely find technology competitors and analyze competitive situation of industrial technology. A method for discovering technology competitor groups based on graph clustering is put forward to improve the precision of clustering results. The method extracts the text terms of patents to build vector space model, counts the numbers of similar patents of technology competitors and uses LinLog graph clustering tool to mine technology competitor groups. The patent data of Chinese fuel cell was collected to carry out the experiment of this research and the experiment results showed that the presented clustering analysis method is effective.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 3rd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2017)
Series
Advances in Engineering Research
Publication Date
September 2017
ISBN
10.2991/eeeis-17.2017.71
ISSN
2352-5401
DOI
10.2991/eeeis-17.2017.71How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Yong-Sheng YU
AU  - Hong-Qi HAN
AU  - Zhong LI
PY  - 2017/09
DA  - 2017/09
TI  - The Method for Discovering Technology Competitor Groups Based on Graph Clustering
BT  - Proceedings of the 3rd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2017)
PB  - Atlantis Press
SP  - 484
EP  - 489
SN  - 2352-5401
UR  - https://doi.org/10.2991/eeeis-17.2017.71
DO  - 10.2991/eeeis-17.2017.71
ID  - YU2017/09
ER  -