Robust Locator Layout Design for B-pillar Based on Taguchi Experiment

DOI

10.2991/mmeceb-15.2016.193How to use a DOI?

Keywords

assembly deviation; locator layout; Taguchi orthogonal experiment; B-pillar; 3DCS

Abstract

For solving the existing problems of assembly quality of B-pillar, a robust design approach was utilized to optimize locator layout of Reinf Pillar and Side Beam Threshold so that the assembly deviation of B-Pillar was minimized. Taguchi orthogonal experiment was carried out to perform the idea by taking the locators coordinate as design parameters, taking the manufacturing and positioning deviation of parts as noise factors. The gap value between Reinf Pillar and Side-body Panel was considered as the measurement index. Furthermore, based on the establishment of robust evaluation function and signal-to-noise ratio formula, the robust layout scheme was determined. The 3DCS(Dimensional Control Systems), a tolerance simulation software, was running, and the simulation analysis results show that robust design greatly reduces the assembly gap, effectively solving the problem of large assembly deviation and quality fluctuation of B-Pillar.

Copyright

© 2016, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Yu-feng Xia
AU  - Li Ren
AU  - Cai-hong Ye
AU  - Li Wang
PY  - 2015/12
DA  - 2015/12
TI  - Robust Locator Layout Design for B-pillar Based on Taguchi Experiment
BT  - Proceedings of the 2015 2nd International Conference on Machinery, Materials Engineering, Chemical Engineering and Biotechnology
PB  - Atlantis Press
SP  - 961
EP  - 967
SN  - 2352-5401
UR  - https://doi.org/10.2991/mmeceb-15.2016.193
DO  - 10.2991/mmeceb-15.2016.193
ID  - Xia2015/12
ER  -