On-line Detection Method of Quality Defects in Manufacturing Process based on Wavelet Finite Element
Bin Zeng, Yuxi Wang, Quanming He, Xiaoli Jiang
Available Online June 2015.
- https://doi.org/10.2991/meici-15.2015.154How to use a DOI?
- Lifting Wavelet; Adaptive Finite Element; Modal Parameters; Stress Wave
- In this paper, researchers use a wavelet-based solution to enhance the adaptive finite element method flaw inherent frequency beam, and study to conclude a particular state and the intrinsic link between the modal parameters, and establish a precise qualitative and quantitative identification based on the establishment of internal defects lifting wavelet adaptive format FEM model, accurate identification of internal defects in the category, location, size and other qualitative and quantitative. Defecting detection technology will be applied to the adaptive wavelet lifting scheme based on the finite element method quality manufacturing process and have achieved good experimental results.
- Open Access
- This is an open access article distributed under the CC BY-NC license.
Cite this article
TY - CONF AU - Bin Zeng AU - Yuxi Wang AU - Quanming He AU - Xiaoli Jiang PY - 2015/06 DA - 2015/06 TI - On-line Detection Method of Quality Defects in Manufacturing Process based on Wavelet Finite Element BT - 2015 International Conference on Management, Education, Information and Control PB - Atlantis Press SP - 877 EP - 881 SN - 1951-6851 UR - https://doi.org/10.2991/meici-15.2015.154 DO - https://doi.org/10.2991/meici-15.2015.154 ID - Zeng2015/06 ER -