On-line Detection Method of Quality Defects in Manufacturing Process based on Wavelet Finite Element

DOI

10.2991/meici-15.2015.154How to use a DOI?

Keywords

Lifting Wavelet; Adaptive Finite Element; Modal Parameters; Stress Wave

Abstract

In this paper, researchers use a wavelet-based solution to enhance the adaptive finite element method flaw inherent frequency beam, and study to conclude a particular state and the intrinsic link between the modal parameters, and establish a precise qualitative and quantitative identification based on the establishment of internal defects lifting wavelet adaptive format FEM model, accurate identification of internal defects in the category, location, size and other qualitative and quantitative. Defecting detection technology will be applied to the adaptive wavelet lifting scheme based on the finite element method quality manufacturing process and have achieved good experimental results.

Copyright

© 2015, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Bin Zeng
AU  - Yuxi Wang
AU  - Quanming He
AU  - Xiaoli Jiang
PY  - 2015/06
DA  - 2015/06
TI  - On-line Detection Method of Quality Defects in Manufacturing Process based on Wavelet Finite Element
BT  - Proceedings of the 2015 International Conference on Management, Education, Information and Control
PB  - Atlantis Press
SP  - 877
EP  - 881
SN  - 1951-6851
UR  - https://doi.org/10.2991/meici-15.2015.154
DO  - 10.2991/meici-15.2015.154
ID  - Zeng2015/06
ER  -