Proceedings of the 2015 International Conference on Management, Education, Information and Control

On-line Detection Method of Quality Defects in Manufacturing Process based on Wavelet Finite Element

Authors
Bin Zeng, Yuxi Wang, Quanming He, Xiaoli Jiang
Corresponding Author
Bin Zeng
Available Online June 2015.
DOI
https://doi.org/10.2991/meici-15.2015.154How to use a DOI?
Keywords
Lifting Wavelet; Adaptive Finite Element; Modal Parameters; Stress Wave
Abstract
In this paper, researchers use a wavelet-based solution to enhance the adaptive finite element method flaw inherent frequency beam, and study to conclude a particular state and the intrinsic link between the modal parameters, and establish a precise qualitative and quantitative identification based on the establishment of internal defects lifting wavelet adaptive format FEM model, accurate identification of internal defects in the category, location, size and other qualitative and quantitative. Defecting detection technology will be applied to the adaptive wavelet lifting scheme based on the finite element method quality manufacturing process and have achieved good experimental results.
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Proceedings
2015 International Conference on Management, Education, Information and Control
Part of series
Advances in Intelligent Systems Research
Publication Date
June 2015
ISBN
978-94-62520-85-1
ISSN
1951-6851
DOI
https://doi.org/10.2991/meici-15.2015.154How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Bin Zeng
AU  - Yuxi Wang
AU  - Quanming He
AU  - Xiaoli Jiang
PY  - 2015/06
DA  - 2015/06
TI  - On-line Detection Method of Quality Defects in Manufacturing Process based on Wavelet Finite Element
BT  - 2015 International Conference on Management, Education, Information and Control
PB  - Atlantis Press
SP  - 877
EP  - 881
SN  - 1951-6851
UR  - https://doi.org/10.2991/meici-15.2015.154
DO  - https://doi.org/10.2991/meici-15.2015.154
ID  - Zeng2015/06
ER  -