High-precision automated testing system for wireless sensor network IC
Authors
Xingcheng Zhang, Xuan Tang, Zhen Meng, Mou Liu, Yuepeng Yan
Corresponding Author
Xingcheng Zhang
Available Online October 2015.
- DOI
- 10.2991/iwmecs-15.2015.85How to use a DOI?
- Keywords
- Internet of Things, Wireless Sensor Network, Automated Test, High Precision, RF, IC Test
- Abstract
This paper introduces a high precision automated test system. We built an automated testing platform using programmable test equipments and designed a series of test boards to adapt the test process. Combined virtual instrument technology and software radio technology, we realized to test the wireless sensor network IC automatically. Compared with other test system, this system has the advantages of high precision, high degree of automation and strong portability etc. It’s fast and convenient to change test function and has a lowest cost of long-term use. This system can be used in the laboratory test and small batch automated test system, and also can be applied to large quantities of chip test production line.
- Copyright
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Xingcheng Zhang AU - Xuan Tang AU - Zhen Meng AU - Mou Liu AU - Yuepeng Yan PY - 2015/10 DA - 2015/10 TI - High-precision automated testing system for wireless sensor network IC BT - Proceedings of the 2015 2nd International Workshop on Materials Engineering and Computer Sciences PB - Atlantis Press SP - 425 EP - 430 SN - 2352-538X UR - https://doi.org/10.2991/iwmecs-15.2015.85 DO - 10.2991/iwmecs-15.2015.85 ID - Zhang2015/10 ER -