A Method for Complex Event Detection of Out-of-Order RFID Data Flow
Authors
Ye Ding, He Xu, Ruchuan Wang, Weiwei Shen
Corresponding Author
Ye Ding
Available Online October 2015.
- DOI
- 10.2991/iwmecs-15.2015.40How to use a DOI?
- Keywords
- RFID; Complex Event Detection; Binary Tree; Out-of-Order
- Abstract
Because RFID events contain features of real-time and mass resistance, there are some issues through the existing complex event detection method for processing, such as inefficient speed and taking up larger memory space. To solve these problems, a complex event detection method based on binary tree is proposed. The algorithm designs an effective binary tree and combines the atomic events into complex events. Analysis shows that the complex event detection method has high efficiency and accuracy in theory and operational feasibility.
- Copyright
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Ye Ding AU - He Xu AU - Ruchuan Wang AU - Weiwei Shen PY - 2015/10 DA - 2015/10 TI - A Method for Complex Event Detection of Out-of-Order RFID Data Flow BT - Proceedings of the 2015 2nd International Workshop on Materials Engineering and Computer Sciences PB - Atlantis Press SP - 214 EP - 217 SN - 2352-538X UR - https://doi.org/10.2991/iwmecs-15.2015.40 DO - 10.2991/iwmecs-15.2015.40 ID - Ding2015/10 ER -