Proceedings of the 2007 International Conference on Intelligent Systems and Knowledge Engineering (ISKE 2007)

Reliability Analysis of Circuit Performance Based on Random Set Theory

Authors
Xiaobin Xu1, Wen Chenglin, Liu Rongli
1Department of Electrical and Automation, Shanghai Maritime University
Corresponding Author
Xiaobin Xu
Available Online October 2007.
DOI
https://doi.org/10.2991/iske.2007.59How to use a DOI?
Keywords
Random set theory, Reliability of circuit performance,Monte-Carlo analysis, Tolerance analysis.
Abstract

Circuit performance is a function of circuit parameters. If these parameters are random variables, the perfor-mance index is also a random variable. System performance can be determined by value of this index and more importantly, by the probability that it is maintained in specified tolerance range. To evaluate reliability of circuit performance is to analyze tolerance range and corresponding probability in order to determine robustness of circuit design. In this paper, random set theory is used to describe these parameter variables and provide a simple and flexible method for evaluating reliability of circuit performance, which is alternative to Monte-Carlo analysis, but reduces the number of calculations drastically.

Copyright
© 2007, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

Volume Title
Proceedings of the 2007 International Conference on Intelligent Systems and Knowledge Engineering (ISKE 2007)
Series
Advances in Intelligent Systems Research
Publication Date
October 2007
ISBN
978-90-78677-04-8
ISSN
1951-6851
DOI
https://doi.org/10.2991/iske.2007.59How to use a DOI?
Copyright
© 2007, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Xiaobin Xu
AU  - Wen Chenglin
AU  - Liu Rongli
PY  - 2007/10
DA  - 2007/10
TI  - Reliability Analysis of Circuit Performance Based on Random Set Theory
BT  - Proceedings of the 2007 International Conference on Intelligent Systems and Knowledge Engineering (ISKE 2007)
PB  - Atlantis Press
SP  - 351
EP  - 358
SN  - 1951-6851
UR  - https://doi.org/10.2991/iske.2007.59
DO  - https://doi.org/10.2991/iske.2007.59
ID  - Xu2007/10
ER  -