Proceedings of the 4th International Conference on Mechatronics, Materials, Chemistry and Computer Engineering 2015

Technique of reproducing bug and debugging under complex environment

Authors
Jun Luo, Jinhua Li
Corresponding Author
Jun Luo
Available Online December 2015.
DOI
10.2991/icmmcce-15.2015.454How to use a DOI?
Keywords
Test Automation, Reproduce Bug, Debug, Docker, Service.
Abstract

Test Automation is widely used. Since there are some differences between the environment of test automation and development, developers sometimes can’t reproduce bugs in their local environment based on bug reports. To solve the issue, this paper introduces an approach that integrates the environment of test automation and development. The solution uses Docker to launch service of integrated environment. Compared with solution based on cloning virtual machine, the solution has three main advantages. It helps developers to reproduce bug and debug, fix bug and verify the fix; it launches an integrated environment in a short time; and it takes much less resources. The solution is valuable for both test automation and development.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 4th International Conference on Mechatronics, Materials, Chemistry and Computer Engineering 2015
Series
Advances in Computer Science Research
Publication Date
December 2015
ISBN
10.2991/icmmcce-15.2015.454
ISSN
2352-538X
DOI
10.2991/icmmcce-15.2015.454How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Jun Luo
AU  - Jinhua Li
PY  - 2015/12
DA  - 2015/12
TI  - Technique of reproducing bug and debugging under complex environment
BT  - Proceedings of the 4th International Conference on Mechatronics, Materials, Chemistry and Computer Engineering 2015
PB  - Atlantis Press
SP  - 1058
EP  - 1061
SN  - 2352-538X
UR  - https://doi.org/10.2991/icmmcce-15.2015.454
DO  - 10.2991/icmmcce-15.2015.454
ID  - Luo2015/12
ER  -