Proceedings of the 2016 3rd International Conference on Mechatronics and Information Technology

FMECA for LRM based on Degradation Data

Authors
Ran Chen, Guangyao Lian, Mengxue Geng, Baochen Li, Liying Cai
Corresponding Author
Ran Chen
Available Online April 2016.
DOI
10.2991/icmit-16.2016.22How to use a DOI?
Keywords
Line Replaceable Module,Accelerated Degradation Test,FMECA,Failure mode
Abstract

Failure Mode Effect and Critically Analysis(FMECA) is one of the key technologies in testability verification test that based on plenty of failure samples.Line replaceable module(LRM) is the core of the new generation avionics system and military equipment electronic system. Failure data of LRM is difficult to acquire under natural conditions,however,it could be obtained fleetly through accelerated degradation test(ADT).According to the degradation data obtained from the accelerated degradation test and the degradation model, the typical failure modes and the occurrence probability of the LRM could be obtained.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 3rd International Conference on Mechatronics and Information Technology
Series
Advances in Computer Science Research
Publication Date
April 2016
ISBN
10.2991/icmit-16.2016.22
ISSN
2352-538X
DOI
10.2991/icmit-16.2016.22How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Ran Chen
AU  - Guangyao Lian
AU  - Mengxue Geng
AU  - Baochen Li
AU  - Liying Cai
PY  - 2016/04
DA  - 2016/04
TI  - FMECA for LRM based on Degradation Data
BT  - Proceedings of the 2016 3rd International Conference on Mechatronics and Information Technology
PB  - Atlantis Press
SP  - 115
EP  - 120
SN  - 2352-538X
UR  - https://doi.org/10.2991/icmit-16.2016.22
DO  - 10.2991/icmit-16.2016.22
ID  - Chen2016/04
ER  -