Proceedings of the First International Conference on Information Sciences, Machinery, Materials and Energy

The relationship between the phase interface valence electron structure of Mg-Al alloy and mechanical properties

Authors
Jie Yan, Jun Xie
Corresponding Author
Jie Yan
Available Online July 2015.
DOI
10.2991/icismme-15.2015.31How to use a DOI?
Keywords
electron density; the valence electron structures of the interface; interfacial stress
Abstract

It is found that the electron density of -Mg17Al12(110) Mg-Al(0001) interfaces declines gradually with increasing Al element, namely interfacial electron density declines.Compared with -Mg17Al12(110) Mg-Al(0001) interfaces, Mg2Si(001) Mg-Al(0001) has greater interfacial stress, that is to say the strengthening effect of Mg2Si to Mg-Al alloys is greater than -Mg17Al12(110) to Mg-Al alloys. Obviously it is interfacial consolidation under higher intensity scale or greater stress.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the First International Conference on Information Sciences, Machinery, Materials and Energy
Series
Advances in Intelligent Systems Research
Publication Date
July 2015
ISBN
10.2991/icismme-15.2015.31
ISSN
1951-6851
DOI
10.2991/icismme-15.2015.31How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Jie Yan
AU  - Jun Xie
PY  - 2015/07
DA  - 2015/07
TI  - The relationship between the phase interface valence electron structure of Mg-Al alloy and mechanical properties
BT  - Proceedings of the First International Conference on Information Sciences, Machinery, Materials and Energy
PB  - Atlantis Press
SP  - 152
EP  - 155
SN  - 1951-6851
UR  - https://doi.org/10.2991/icismme-15.2015.31
DO  - 10.2991/icismme-15.2015.31
ID  - Yan2015/07
ER  -