Proceedings of the 2015 International Conference on Electrical, Computer Engineering and Electronics

Research on the type of load of accessing to microgrid based on reliability

Authors
Longlong Zhang, Ming Sun
Corresponding Author
Longlong Zhang
Available Online June 2015.
DOI
10.2991/icecee-15.2015.314How to use a DOI?
Keywords
Microgrid; Distributed Generation; Power supply reliability; Monte Carlo simulation.
Abstract

The microgrid provides a new form of Distributed Generation accessed to distribution network .With the development and application of microgrid technologies, its ability to meet the power supply reliability needs of loads in microgrid has become a problem that should be solved. To this end, the paper divides the loads according to the power supply reliability, builds a microgrid model constituting of wind/photovoltaic power /independent storage power, and investigates the reliability evaluation method based on Monte Carlo simulation. By an example of IEEE-RBTS system, the paper compares the reliability level of loads in normal distribution network with those in the microgrid, finally draws the conclusion, the third-class load is the most suitable load accessed to microgrid.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Electrical, Computer Engineering and Electronics
Series
Advances in Computer Science Research
Publication Date
June 2015
ISBN
10.2991/icecee-15.2015.314
ISSN
2352-538X
DOI
10.2991/icecee-15.2015.314How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Longlong Zhang
AU  - Ming Sun
PY  - 2015/06
DA  - 2015/06
TI  - Research on the type of load of accessing to microgrid based on reliability
BT  - Proceedings of the 2015 International Conference on Electrical, Computer Engineering and Electronics
PB  - Atlantis Press
SP  - 1665
EP  - 1670
SN  - 2352-538X
UR  - https://doi.org/10.2991/icecee-15.2015.314
DO  - 10.2991/icecee-15.2015.314
ID  - Zhang2015/06
ER  -