Proceedings of the 2015 International Conference on Electrical, Computer Engineering and Electronics

Reliability Assessment based on pseudo-life distribution missile degradation data analysis

Authors
Wen Jun XI, Wenshuang Wang
Corresponding Author
Wen Jun XI
Available Online June 2015.
DOI
https://doi.org/10.2991/icecee-15.2015.212How to use a DOI?
Keywords
missiles; field data; life; reliability
Abstract
Through the rational use of test data on a regular basis to assess the missile storage reliability. This paper studies the detection of the type of missile components, missile components for storage summarizes the proposed four kinds of missile site testing data acquisition program, and analyze the advantages and disadvantages of each scheme; take degenerate pseudo-life distribution data analysis methods to the field test data perform numerical example to verify the correctness and availability solutions.
Open Access
This is an open access article distributed under the CC BY-NC license.

Download article (PDF)

Proceedings
Part of series
Advances in Computer Science Research
Publication Date
June 2015
ISBN
978-94-62520-81-3
ISSN
2352-538X
DOI
https://doi.org/10.2991/icecee-15.2015.212How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Wen Jun XI
AU  - Wenshuang Wang
PY  - 2015/06
DA  - 2015/06
TI  - Reliability Assessment based on pseudo-life distribution missile degradation data analysis
PB  - Atlantis Press
SP  - 1127
EP  - 1131
SN  - 2352-538X
UR  - https://doi.org/10.2991/icecee-15.2015.212
DO  - https://doi.org/10.2991/icecee-15.2015.212
ID  - XI2015/06
ER  -