Proceedings of the 2015 International Conference on Electrical, Computer Engineering and Electronics

Research and Simulation of the Damage from Missile Attack

Authors
Xiao Hu, Zhigang Zhang, MengQi Zhang
Corresponding Author
Xiao Hu
Available Online June 2015.
DOI
https://doi.org/10.2991/icecee-15.2015.9How to use a DOI?
Keywords
Non-explosive missile; Damage degree; Monte Carlo simulation
Abstract

In the career of missile, the extent of the damage caused by the missile can effectively determine the resources demand of the battlefield repair, which is necessary to develop repair plan, improve equipment battlefield repair ability, maintain and restore equipment operational capability [1]. In this paper, we mainly study the non-explosive missile attack on the tall building and simulate the flying process as well as damage degree combined with mathematical modeling, probability analysis and Monte Carlo simulation method. The effective simulation by virtual experiment reasonably evaluates the ground-weapon damage caused by missiles and has significant guidance to the battlefield repair.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Electrical, Computer Engineering and Electronics
Series
Advances in Computer Science Research
Publication Date
June 2015
ISBN
978-94-62520-81-3
ISSN
2352-538X
DOI
https://doi.org/10.2991/icecee-15.2015.9How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Xiao Hu
AU  - Zhigang Zhang
AU  - MengQi Zhang
PY  - 2015/06
DA  - 2015/06
TI  - Research and Simulation of the Damage from Missile Attack
BT  - Proceedings of the 2015 International Conference on Electrical, Computer Engineering and Electronics
PB  - Atlantis Press
SP  - 38
EP  - 41
SN  - 2352-538X
UR  - https://doi.org/10.2991/icecee-15.2015.9
DO  - https://doi.org/10.2991/icecee-15.2015.9
ID  - Hu2015/06
ER  -