Proceedings of the 2nd International Conference on Computer Science and Electronics Engineering (ICCSEE 2013)

Sensitivity analysis of parameter variation in T network impedance-matching

Authors
Jianwen Tan, Sijian Deng, Fangwei Ye, Chunliang Zhao, Deping Zeng
Corresponding Author
Jianwen Tan
Available Online March 2013.
DOI
10.2991/iccsee.2013.15How to use a DOI?
Keywords
Impedance matching, Circuit analysis, Sensitivity analysis, Parameter variation, Component tolerance
Abstract

In the practical application of passive network impedance matching, variations in component tolerance, process, and load impedance may make the performance of impedance-matching network deviate from the designed or simulated result. The current work investigates the effect of these parameter variations on performance of T network impedance matching. The sensitivities of the resulting reflection coefficient to the parameter variations are theoretically studied. The formulas for calculating the resulting reflection coefficient caused by parameter variations are derived from quality factor-based design method. The analysis results can provide reference for design process and an opportunity for a better understanding of the dynamic behavior of the narrowband impedance-matching networks.

Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference on Computer Science and Electronics Engineering (ICCSEE 2013)
Series
Advances in Intelligent Systems Research
Publication Date
March 2013
ISBN
978-90-78677-61-1
ISSN
1951-6851
DOI
10.2991/iccsee.2013.15How to use a DOI?
Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Jianwen Tan
AU  - Sijian Deng
AU  - Fangwei Ye
AU  - Chunliang Zhao
AU  - Deping Zeng
PY  - 2013/03
DA  - 2013/03
TI  - Sensitivity analysis of parameter variation in T network impedance-matching
BT  - Proceedings of the 2nd International Conference on Computer Science and Electronics Engineering (ICCSEE 2013)
PB  - Atlantis Press
SP  - 60
EP  - 62
SN  - 1951-6851
UR  - https://doi.org/10.2991/iccsee.2013.15
DO  - 10.2991/iccsee.2013.15
ID  - Tan2013/03
ER  -