A Comprehensive Test Compression Scheme based on Precomputed Test Sets
- 10.2991/iccia.2012.221How to use a DOI?
- Terms—Run-length code, run-length assignment symmetrical code, test data compression.
To cope with increasingly rigorous challenges that large scale digital integrated circuit testing is confronted with, a comprehensive compression scheme consisting of test-bit rearrangement algorithm, run-length assignment strategy and symmetrical code is proposed. The presented test-bit rearrangement algorithm can fasten don’t-care bits, 0s or 1s in every test pattern on one of its end to the greatest extent so as to lengthen end-run blocks and decrease number of short run-lengths. A dynamical don’t-care assignment strategy based on run-lengths can be used to specify the remaining don’t-care bits after the test-bit rearrangement, which can decrease run-length splitting and maximize length of run-lengths. The symmetrical code benefits from long run-lengths and only uses 2 4-bit short code words to identify end-run blocks almost as long as a test pattern, and hence the utilization ratio of code words can be heightened. The presented experiment results show that the proposed comprehensive scheme can obtain very higher data compression ratios than other compression ones published up to now, especially for large scale digital integrated circuits, and considerably decrease test power dissipations.
- © 2013, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Zhijian Tian AU - Fayong Zhao PY - 2014/05 DA - 2014/05 TI - A Comprehensive Test Compression Scheme based on Precomputed Test Sets BT - Proceedings of the 2012 2nd International Conference on Computer and Information Application (ICCIA 2012) PB - Atlantis Press SP - 907 EP - 913 SN - 1951-6851 UR - https://doi.org/10.2991/iccia.2012.221 DO - 10.2991/iccia.2012.221 ID - Tian2014/05 ER -