Proceedings of the 2nd International Conference on Electrical and Electronic Engineering (EEE 2019)

Study of the Twelve Busbar Technology and the Stress-Induced Degradation within the Solar Modules

Authors
Guo-ping Huang, Hao Zhuang, Su Zhou, Ya-shuai Jiang, Peng Chen, Jing-nan Li
Corresponding Author
Hao Zhuang
Available Online July 2019.
DOI
https://doi.org/10.2991/eee-19.2019.34How to use a DOI?
Keywords
Multi-busbar, Light secondary utilization, EVA thickness, Stress-induced degradation
Abstract
To achieve cost reduction and efficiency increase of module products, the multi-busbar technology has recently been applied in photovoltaic crystalline silicon modules. Compared with the current five busbar modules, the multi-busbar modules use round ribbons to reduce the resistance loss and increase the secondary utilization of the light on the surface of the ribbon, thereby increasing the power output of modules. However, the use of multi-busbar technology requires redesign of the cell pattern, and thicker solder ribbons may probably lead to more degradation due to inner stress. This stress-induced degradation of the twelve busbar modules was investigated by thermal cycling test and electroluminescence test. The test results demonstrate that by increasing the thickness of EVA, the cracking of the cells caused by the stress during the thermal cycle can be effectively reduced. Our twelve busbar modules exhibited good reliability in the damp heat and UV sequence tests.
Open Access
This is an open access article distributed under the CC BY-NC license.

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Proceedings
2nd International Conference on Electrical and Electronic Engineering (EEE 2019)
Part of series
Advances in Engineering Research
Publication Date
July 2019
ISBN
978-94-6252-754-6
ISSN
2352-5401
DOI
https://doi.org/10.2991/eee-19.2019.34How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Guo-ping Huang
AU  - Hao Zhuang
AU  - Su Zhou
AU  - Ya-shuai Jiang
AU  - Peng Chen
AU  - Jing-nan Li
PY  - 2019/07
DA  - 2019/07
TI  - Study of the Twelve Busbar Technology and the Stress-Induced Degradation within the Solar Modules
BT  - 2nd International Conference on Electrical and Electronic Engineering (EEE 2019)
PB  - Atlantis Press
SP  - 197
EP  - 202
SN  - 2352-5401
UR  - https://doi.org/10.2991/eee-19.2019.34
DO  - https://doi.org/10.2991/eee-19.2019.34
ID  - Huang2019/07
ER  -