Study of the Twelve Busbar Technology and the Stress-Induced Degradation within the Solar Modules
Guo-ping Huang, Hao Zhuang, Su Zhou, Ya-shuai Jiang, Peng Chen, Jing-nan Li
Available Online July 2019.
- https://doi.org/10.2991/eee-19.2019.34How to use a DOI?
- Multi-busbar, Light secondary utilization, EVA thickness, Stress-induced degradation
- To achieve cost reduction and efficiency increase of module products, the multi-busbar technology has recently been applied in photovoltaic crystalline silicon modules. Compared with the current five busbar modules, the multi-busbar modules use round ribbons to reduce the resistance loss and increase the secondary utilization of the light on the surface of the ribbon, thereby increasing the power output of modules. However, the use of multi-busbar technology requires redesign of the cell pattern, and thicker solder ribbons may probably lead to more degradation due to inner stress. This stress-induced degradation of the twelve busbar modules was investigated by thermal cycling test and electroluminescence test. The test results demonstrate that by increasing the thickness of EVA, the cracking of the cells caused by the stress during the thermal cycle can be effectively reduced. Our twelve busbar modules exhibited good reliability in the damp heat and UV sequence tests.
- Open Access
- This is an open access article distributed under the CC BY-NC license.
Cite this article
TY - CONF AU - Guo-ping Huang AU - Hao Zhuang AU - Su Zhou AU - Ya-shuai Jiang AU - Peng Chen AU - Jing-nan Li PY - 2019/07 DA - 2019/07 TI - Study of the Twelve Busbar Technology and the Stress-Induced Degradation within the Solar Modules BT - 2nd International Conference on Electrical and Electronic Engineering (EEE 2019) PB - Atlantis Press SP - 197 EP - 202 SN - 2352-5401 UR - https://doi.org/10.2991/eee-19.2019.34 DO - https://doi.org/10.2991/eee-19.2019.34 ID - Huang2019/07 ER -