Proceedings of the 2nd International Conference on Electrical and Electronic Engineering (EEE 2019)

Fault Transient Analysis of Flexible Medium Voltage DC Distribution

Authors
Xiao-ping Yang, Tian-hao Feng, Ning-bo Zhao
Corresponding Author
Xiao-ping Yang
Available Online July 2019.
DOI
https://doi.org/10.2991/eee-19.2019.15How to use a DOI?
Keywords
DC distribution, Fault transient analysis, Grounding fault, Supply reliability, Fault crossing
Abstract
The analysis of fault transient characteristics of flexible dc distribution is the basis of dc distribution protection technology. Based on the construction of the two-terminal power supply code flexible dc distribution system, the problems of different system grounding methods are analyzed in detail, and the connection of the converter transformer using Yn/△ and the dc capacitance using split midpoint high-resistance grounding method are proposed. Under this grounding method, transient models of transient grounding faults of ac and dc lines are established and their transient characteristics are studied. Using PSCAD/EMTDC software to build the simulation model, through the analysis and simulation proved that the system grounding method can effectively limit the instantaneity ground fault transient fault current during the period of over current levels, to maintain the dc voltage stability, improve power supply reliability of the system, has the strong ability of fault crossing ability and fault recovery.
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Proceedings
2nd International Conference on Electrical and Electronic Engineering (EEE 2019)
Part of series
Advances in Engineering Research
Publication Date
July 2019
ISBN
978-94-6252-754-6
ISSN
2352-5401
DOI
https://doi.org/10.2991/eee-19.2019.15How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Xiao-ping Yang
AU  - Tian-hao Feng
AU  - Ning-bo Zhao
PY  - 2019/07
DA  - 2019/07
TI  - Fault Transient Analysis of Flexible Medium Voltage DC Distribution
BT  - 2nd International Conference on Electrical and Electronic Engineering (EEE 2019)
PB  - Atlantis Press
SP  - 85
EP  - 89
SN  - 2352-5401
UR  - https://doi.org/10.2991/eee-19.2019.15
DO  - https://doi.org/10.2991/eee-19.2019.15
ID  - Yang2019/07
ER  -