Proceedings of the 2nd International Conference on Electrical and Electronic Engineering (EEE 2019)

A New Method for Reducing the Leakage Current in the Readout Circuit of Ultraviolet Focal Plane Detector

Authors
Chen Zhang, Xi-ran Zhang, Wei Zhu, Hui Zhong, Yu Shi
Corresponding Author
Hui Zhong
Available Online July 2019.
DOI
https://doi.org/10.2991/eee-19.2019.8How to use a DOI?
Keywords
Readout circuit, CTIA, Low-Leakage
Abstract
A readout circuit with low leakage current is presented which performs leakage current suppression and integration linearity enhancement. An additional transmission gate is added to suppress the leakage current by forcing each end of MOSFETs in the transmission gate to be equal so that the discharge circuit of integration capacitor can be completely cut off when the integration circuit is at the stage of integration. It is simulated and implemented in a standard 0.18-µm CMOS process. The results show the leakage current is reduced to 1.5 nA which is 4 times lower compared with conventional circuit. The linearity of integration is 99.9% in proposed integration circuit.
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This is an open access article distributed under the CC BY-NC license.

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Proceedings
2nd International Conference on Electrical and Electronic Engineering (EEE 2019)
Part of series
Advances in Engineering Research
Publication Date
July 2019
ISBN
978-94-6252-754-6
ISSN
2352-5401
DOI
https://doi.org/10.2991/eee-19.2019.8How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Chen Zhang
AU  - Xi-ran Zhang
AU  - Wei Zhu
AU  - Hui Zhong
AU  - Yu Shi
PY  - 2019/07
DA  - 2019/07
TI  - A New Method for Reducing the Leakage Current in the Readout Circuit of Ultraviolet Focal Plane Detector
BT  - 2nd International Conference on Electrical and Electronic Engineering (EEE 2019)
PB  - Atlantis Press
SP  - 41
EP  - 45
SN  - 2352-5401
UR  - https://doi.org/10.2991/eee-19.2019.8
DO  - https://doi.org/10.2991/eee-19.2019.8
ID  - Zhang2019/07
ER  -