Research on Fast Imaging Method of X - Ray Flat Panel Detector Based on Pre - Offset
Chengcheng Fan, Xiao'ou Li, Ronghua Ling, Han Xiao
Available Online June 2017.
- https://doi.org/10.2991/caai-17.2017.129How to use a DOI?
- flat panel detector; offset template; dark-field calibration
- In view of the problem that the X-ray flat panel detector products are slow from receiving X-Ray tube's exposure to generating the X-Ray medical image, it can not meet the time requirement of post-processing customers. It uses pre-offset calibration to reconstruct dark-field template based on the ck1417 flat panel detector. This series of templates can not only fit the dark-field map in different time window but could also calibrate the dark-field map influenced by different temperatures according to the circumstances that the flat panel detectors are easy to have error correction in different temperatures. This could effectively reduce the time to collect X-Ray Images and provide more time for X-Ray Image post-treatment manufacturer and let post-treatment more explicit and detailed.
- Open Access
- This is an open access article distributed under the CC BY-NC license.
Cite this article
TY - CONF AU - Chengcheng Fan AU - Xiao'ou Li AU - Ronghua Ling AU - Han Xiao PY - 2017/06 DA - 2017/06 TI - Research on Fast Imaging Method of X - Ray Flat Panel Detector Based on Pre - Offset BT - 2017 2nd International Conference on Control, Automation and Artificial Intelligence (CAAI 2017) PB - Atlantis Press SP - 581 EP - 584 SN - 1951-6851 UR - https://doi.org/10.2991/caai-17.2017.129 DO - https://doi.org/10.2991/caai-17.2017.129 ID - Fan2017/06 ER -