Proceedings of the 2017 2nd International Conference on Control, Automation and Artificial Intelligence (CAAI 2017)

Research on Fast Imaging Method of X - Ray Flat Panel Detector Based on Pre - Offset

Authors
Chengcheng Fan, Xiao'ou Li, Ronghua Ling, Han Xiao
Corresponding Author
Chengcheng Fan
Available Online June 2017.
DOI
10.2991/caai-17.2017.129How to use a DOI?
Keywords
flat panel detector; offset template; dark-field calibration
Abstract

In view of the problem that the X-ray flat panel detector products are slow from receiving X-Ray tube's exposure to generating the X-Ray medical image, it can not meet the time requirement of post-processing customers. It uses pre-offset calibration to reconstruct dark-field template based on the ck1417 flat panel detector. This series of templates can not only fit the dark-field map in different time window but could also calibrate the dark-field map influenced by different temperatures according to the circumstances that the flat panel detectors are easy to have error correction in different temperatures. This could effectively reduce the time to collect X-Ray Images and provide more time for X-Ray Image post-treatment manufacturer and let post-treatment more explicit and detailed.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2017 2nd International Conference on Control, Automation and Artificial Intelligence (CAAI 2017)
Series
Advances in Intelligent Systems Research
Publication Date
June 2017
ISBN
10.2991/caai-17.2017.129
ISSN
1951-6851
DOI
10.2991/caai-17.2017.129How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Chengcheng Fan
AU  - Xiao'ou Li
AU  - Ronghua Ling
AU  - Han Xiao
PY  - 2017/06
DA  - 2017/06
TI  - Research on Fast Imaging Method of X - Ray Flat Panel Detector Based on Pre - Offset
BT  - Proceedings of the 2017 2nd International Conference on Control, Automation and Artificial Intelligence (CAAI 2017)
PB  - Atlantis Press
SP  - 581
EP  - 584
SN  - 1951-6851
UR  - https://doi.org/10.2991/caai-17.2017.129
DO  - 10.2991/caai-17.2017.129
ID  - Fan2017/06
ER  -