Methodological Research on Design for Testability of Mixed-signal IC

DOI

10.2991/caai-17.2017.31How to use a DOI?

Keywords

design for testability; mixed-signal IC; module division; test control signal; additional test structure

Abstract

The concept and classification of design for testability about IC are introduced. As an example, several testability methods for mixed-signal IC sx1701 are given, which include precise module division, effective control signal building and testing structure adding. By using these methods, the testability of sx1701 is good, and it shows that these testability methods are effective.

Copyright

© 2017, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Shuirong Ju
AU  - Jinfei Wang
AU  - Tianshe Wang
AU  - Dong Qin
PY  - 2017/06
DA  - 2017/06
TI  - Methodological Research on Design for Testability of Mixed-signal IC
BT  - Proceedings of the 2017 2nd International Conference on Control, Automation and Artificial Intelligence (CAAI 2017)
PB  - Atlantis Press
SP  - 149
EP  - 151
SN  - 1951-6851
UR  - https://doi.org/10.2991/caai-17.2017.31
DO  - 10.2991/caai-17.2017.31
ID  - Ju2017/06
ER  -