Quality Analysis of Nital Etch Inspection Process With Six Sigma and Kaizen Approach to Reduce Product Defects

DOI

10.2991/978-94-6463-618-5_30How to use a DOI?

Keywords

Nital-Etch Inspection; Defect; Six Sigma; Kaizen

Abstract

PT XYZ is an aircraft component manufacturing company headquartered in the United States. One of the departments at PT XYZ is Non-Destructive Test Department, where defects are often found in one of the processes, Nital- Etch Inspection (NEI). The observations for June 2022 until June 2023 show that the average percentage of product defects in the NEI process is 17.28%, which exceeds the company’s maximum limit of 5%. The purpose of this research is to analyze the Nital Etch process and reduce defects using Six Sigma and Kaizen approaches. The initial identification found five types of defects in the NEI process, grinding burn, local softening of cylindrical components, thin layers, lack of hardness in general, and cracking. The largest deviation was grinding burn, with value of 16,465 Defect per Million Opportunities (DPMO) and 3,63 sigma level. Based on the analysis, the causes of grinding burn defects are the human factor, which is operator’s negligence and lack of supervision, the lack of operator ability and knowledge in operating the machine, and the work fatigue factor. Improvements were made by improving the supervision process for operators, providing regular training, implementing a certification program for grinding operators, creating a balanced work schedule, conducting regular health checks, and designing the workplace to be more ergonomic to reduce physical fatigue. The results of the implementation improvement carried out for 2 weeks, resulted in a decrease in the average product defect to 7.02%.

Copyright

© 2024 The Author(s)

Open Access

Open Access This chapter is licensed under the terms of the Creative Commons Attribution-NonCommercial 4.0 International License (http://creativecommons.org/licenses/by-nc/4.0/), which permits any noncommercial use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license and indicate if changes were made.

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TY  - CONF
AU  - Rendiyatna Ferdian
AU  - Arief Setia Budi
PY  - 2024
DA  - 2024/12/29
TI  - Quality Analysis of Nital Etch Inspection Process With Six Sigma and Kaizen Approach to Reduce Product Defects
BT  - Proceedings of the Widyatama International Conference on Engineering 2024 (WICOENG 2024)
PB  - Atlantis Press
SP  - 283
EP  - 292
SN  - 2352-5401
UR  - https://doi.org/10.2991/978-94-6463-618-5_30
DO  - 10.2991/978-94-6463-618-5_30
ID  - Ferdian2024
ER  -