Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering

Test Case Generation for Vulnerability Detection Using Genetic Algorithm

Authors
Bo Shuai, Haifeng Li, Jian Wang, Quan Zhang, ChaoJing Tang
Corresponding Author
Bo Shuai
Available Online December 2015.
DOI
10.2991/nceece-15.2016.213How to use a DOI?
Keywords
genetic algorithm; fuzz; path coverage; test cost
Abstract

In order to elevate efficiency of traditional Fuzzing technique, a novel method using genetic algorithm is proposed based on path coverage and test cost. There are evidences that GA has been already successful in generating test cases. Considering path coverage as the test adequacy criterion, we have designed a GA-based test data generator that is able to synthesize multiple test data to cover multiple target paths. Meanwhile, in order to reduce the test cost in Fuzzing process, test cost is analyzed respectively from running time and loop structure in the method. Experimental results show that proposed approach could obtain higher vulnerability detection accuracy and efficiency.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering
Series
Advances in Engineering Research
Publication Date
December 2015
ISBN
10.2991/nceece-15.2016.213
ISSN
2352-5401
DOI
10.2991/nceece-15.2016.213How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Bo Shuai
AU  - Haifeng Li
AU  - Jian Wang
AU  - Quan Zhang
AU  - ChaoJing Tang
PY  - 2015/12
DA  - 2015/12
TI  - Test Case Generation for Vulnerability Detection Using Genetic Algorithm
BT  - Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering
PB  - Atlantis Press
SP  - 1198
EP  - 1203
SN  - 2352-5401
UR  - https://doi.org/10.2991/nceece-15.2016.213
DO  - 10.2991/nceece-15.2016.213
ID  - Shuai2015/12
ER  -