Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering

The Practical Inquiry of the AC Withstand Voltage Test Technology of the Same Frequency and Phase Based on the GIS Equipment

Authors
Ting Yuan, Bingfu Xu, Qiang Gu, Bibo Chen
Corresponding Author
Ting Yuan
Available Online December 2015.
DOI
10.2991/nceece-15.2016.129How to use a DOI?
Keywords
GIS equipment; the withstand voltage test of alternating current with the same frequency and phase; practical application.
Abstract

This paper analyzed the basic principles of the alternating current withstand voltage test technology work of the same frequency and phase.And at the same time analyzed the danger that exist during the process of the test that basic on the GIS equipment,put forward corresponding preventive and control measures.Analyzed the applicability of the ac withstand voltage test of the same frequency and phase technology by taking the single busbar connection mode and double busbar connection mode of GIS equipment for example meanwhile,so that the GIS equipment can get promotion and development.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering
Series
Advances in Engineering Research
Publication Date
December 2015
ISBN
10.2991/nceece-15.2016.129
ISSN
2352-5401
DOI
10.2991/nceece-15.2016.129How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Ting Yuan
AU  - Bingfu Xu
AU  - Qiang Gu
AU  - Bibo Chen
PY  - 2015/12
DA  - 2015/12
TI  - The Practical Inquiry of the AC Withstand Voltage Test Technology of the Same Frequency and Phase Based on the GIS Equipment
BT  - Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering
PB  - Atlantis Press
SP  - 696
EP  - 699
SN  - 2352-5401
UR  - https://doi.org/10.2991/nceece-15.2016.129
DO  - 10.2991/nceece-15.2016.129
ID  - Yuan2015/12
ER  -