Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering

Research on software safety growth testing method based on FTPM model

Authors
Zhongxiao Ji, Guohua Jiang
Corresponding Author
Zhongxiao Ji
Available Online December 2015.
DOI
10.2991/nceece-15.2016.110How to use a DOI?
Keywords
Safety Testing; Fault Tree Analysis; Markov Model; Running; Scenario
Abstract

In the key areas of safety, the safety requirements of the software are becoming higher and higher. However, there are all kinds of safety testing methods, or the presence of state space explosion, or the test case is huge, and the safety testing efficiency is low. In order to solve this problem, this paper proposes a safety testing method, which is based on FAPM model. Getting danger of hazardous events which is through using dynamic fault tree analysis. And it is based on the call graph of the program to build the mapping relationship between basic events and operation, operation and code. Then, build a scene using a Markov model. According to the model generation of safety test case, and according to the test stop criterion to judge the adequacy of the testing.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering
Series
Advances in Engineering Research
Publication Date
December 2015
ISBN
978-94-6252-150-6
ISSN
2352-5401
DOI
10.2991/nceece-15.2016.110How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Zhongxiao Ji
AU  - Guohua Jiang
PY  - 2015/12
DA  - 2015/12
TI  - Research on software safety growth testing method based on FTPM model
BT  - Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering
PB  - Atlantis Press
SP  - 588
EP  - 594
SN  - 2352-5401
UR  - https://doi.org/10.2991/nceece-15.2016.110
DO  - 10.2991/nceece-15.2016.110
ID  - Ji2015/12
ER  -