Simulation of Canadian S&P/TSX Composite Index for the First 20 Years in the 21st Century with Random Walk Model
- DOI
- 10.2991/978-94-6463-042-8_199How to use a DOI?
- Keywords
- S&P/TSX Composite Index; random walk; simulation; finance and trade; stock market
- Abstract
The Canadian S&P/TSX Composite Index is a capitalization-weighted equity index that records the stock performance in Toronto Stock Exchange (TSX), which is the primary stock exchange in Canada. The S&P/TSX is closely monitored by investors and becomes a barometer for the health of the Canadian economy. The random walk model is an important tool to prove or disprove the efficient market hypothesis (EMH). Generally, the use of random walk model to test this hypothesis is conducted using statistical tests. Recently, we conducted a series of studies to use the random walk model to directly simulate/fit the major stock indices around the world. As a part of such an effort, we use the random walk model to simulate the S&P/TSX for the first 20 years in the 21st century in this study. The results show that the random walk model can satisfyingly simulate the S&P/TSX trend for the long period, but fails for short periods.
- Copyright
- © 2023 The Author(s)
- Open Access
- Open Access This chapter is licensed under the terms of the Creative Commons Attribution-NonCommercial 4.0 International License (http://creativecommons.org/licenses/by-nc/4.0/), which permits any noncommercial use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license and indicate if changes were made.
Cite this article
TY - CONF AU - Shaomin Yan AU - Guang Wu PY - 2022 DA - 2022/12/29 TI - Simulation of Canadian S&P/TSX Composite Index for the First 20 Years in the 21st Century with Random Walk Model BT - Proceedings of the 2022 International Conference on mathematical statistics and economic analysis (MSEA 2022) PB - Atlantis Press SP - 1369 EP - 1374 SN - 2352-538X UR - https://doi.org/10.2991/978-94-6463-042-8_199 DO - 10.2991/978-94-6463-042-8_199 ID - Yan2022 ER -