Proceedings of the 2016 6th International Conference on Machinery, Materials, Environment, Biotechnology and Computer

Research on Optimal Excitation and Measurement Mode of Electrical Resistance Tomography

Authors
Kun Li, Lei Xu, Yulin Zhang, Zhihao Pan, Yu An
Corresponding Author
Kun Li
Available Online June 2016.
DOI
10.2991/mmebc-16.2016.333How to use a DOI?
Keywords
Electrical Resistance Tomography; excitation mode; measurement mode
Abstract

Excitation and measurement mode of Electrical Resistance Tomography (ERT) system would determine the sensitivity, information quantity and noise immunity of the test field. In this paper, a 16-electrode ERT system is cited to conduct a research on 8 excitation modes and 2 measurement modes by numerical analysis. The independent data volume, equipotential line distribution, as well as amplitude and sensitivity characteristics of measured voltage are separately compared. Considering the overall various factors, Mode7 and the reference measurement mode are considered to be the best choices.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 6th International Conference on Machinery, Materials, Environment, Biotechnology and Computer
Series
Advances in Engineering Research
Publication Date
June 2016
ISBN
978-94-6252-210-7
ISSN
2352-5401
DOI
10.2991/mmebc-16.2016.333How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Kun Li
AU  - Lei Xu
AU  - Yulin Zhang
AU  - Zhihao Pan
AU  - Yu An
PY  - 2016/06
DA  - 2016/06
TI  - Research on Optimal Excitation and Measurement Mode of Electrical Resistance Tomography
BT  - Proceedings of the 2016 6th International Conference on Machinery, Materials, Environment, Biotechnology and Computer
PB  - Atlantis Press
SP  - 1643
EP  - 1648
SN  - 2352-5401
UR  - https://doi.org/10.2991/mmebc-16.2016.333
DO  - 10.2991/mmebc-16.2016.333
ID  - Li2016/06
ER  -