Proceedings of the 2015 International Conference on Mechatronics, Electronic, Industrial and Control Engineering

2015 International Conference on Mechatronics, Electronic, Industrial and Control Engineering (MEIC-15)

📍Shenyang, China🗓️ 1-3 April 2015
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Research on the Fault Test Method of Digital Circuit with Microprocessor

Authors
Jun Liu, Ting Zhang, Yu Zhang
Corresponding Author
Jun Liu
Available Online April 2015.
DOI
10.2991/meic-15.2015.163How to use a DOI?
Keywords
Circuit with Microprocessor Digital;Ant Algorithm;Bus Simulation Test;Emulator;ROM
Abstract

The method of microprocessor circuit fault diagnosis is mainly discussed in this paper. In order to test circuit faults

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Mechatronics, Electronic, Industrial and Control Engineering
Series
Advances in Engineering Research
Publication Date
April 2015
ISBN
978-94-62520-62-2
ISSN
2352-5401
DOI
10.2991/meic-15.2015.163How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

risenwbib
TY  - CONF
AU  - Jun Liu
AU  - Ting Zhang
AU  - Yu Zhang
PY  - 2015/04
DA  - 2015/04
TI  - Research on the Fault Test Method of Digital Circuit with Microprocessor
BT  - Proceedings of the 2015 International Conference on Mechatronics, Electronic, Industrial and Control Engineering
PB  - Atlantis Press
SP  - 715
EP  - 718
SN  - 2352-5401
UR  - https://doi.org/10.2991/meic-15.2015.163
DO  - 10.2991/meic-15.2015.163
ID  - Liu2015/04
ER  -