Research on Sub Pixel Roundness Detection Technology Based on B-spline Lifting Wavelet
- DOI
- 10.2991/meic-15.2015.73How to use a DOI?
- Keywords
- roundness error; B-spline lifting wavelet; sub pixel; multi-resolution analysis; edge detection
- Abstract
In order to realize roundness detection of rotary type parts in industrial field without interruption machining process, an image measurement method was proposed in this paper. Using adaptive threshold, the image edge can be determined by calculating modulus maximum in gradient direction in different scale. A single-pixel edge image will be obtained by synthesizing the multi-scale edge. Center drift problem in roundness evaluation had been solved by pole method. For improving efficiency and precision, a sub pixel roundness detection scheme was proposed by combining B-spline lifting wavelet with quadratic polynomial interpolation. The template part with known size was used to test the effects of different methods. The sub pixel technology can improve the resolution of image obviously. The experimental results show that the proposed detection method has better performance in terms of efficiency and accuracy compared with conventional detection methods. But the detection precision of proposed method was lower than that of roundness instrument measurement. There are still some work to be done in measuring method and denoising. For all that, the method can satisfy medium precision requirement in the general engineering application.
- Copyright
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Yanping Gong AU - Zhigang Huang PY - 2015/04 DA - 2015/04 TI - Research on Sub Pixel Roundness Detection Technology Based on B-spline Lifting Wavelet BT - Proceedings of the 2015 International Conference on Mechatronics, Electronic, Industrial and Control Engineering PB - Atlantis Press SP - 310 EP - 314 SN - 2352-5401 UR - https://doi.org/10.2991/meic-15.2015.73 DO - 10.2991/meic-15.2015.73 ID - Gong2015/04 ER -