Proceedings of the 2015 Joint International Mechanical, Electronic and Information Technology Conference

Study on Vision based On-machine Micro Tool Measurement Method

Authors
Xiaoru Liu, Xi Zhang, Bo Shang, Xianliang Chi
Corresponding Author
Xiaoru Liu
Available Online December 2015.
DOI
10.2991/jimet-15.2015.202How to use a DOI?
Keywords
Micro tool inspection, Dimension measurement, Radial runout, Machine vision.
Abstract

In order to inspect the condition of micro tools automatically and accurately in the micro milling process, a vision based on-machine measurement method is studied in this paper. The proposed methods can measure tool dimension, spindle radial runout and acquire the microscopic image with full depth of focus from both radial and axial direction. Based on the proposed method, a dedicated micro tool measuring system was established, which consists of on-machine measurement unit, control box and software. The measurement experiments on machine tool verified that the proposed methods and the developed measurement system can fulfill the needs of industrial applications.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 Joint International Mechanical, Electronic and Information Technology Conference
Series
Advances in Computer Science Research
Publication Date
December 2015
ISBN
10.2991/jimet-15.2015.202
ISSN
2352-538X
DOI
10.2991/jimet-15.2015.202How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Xiaoru Liu
AU  - Xi Zhang
AU  - Bo Shang
AU  - Xianliang Chi
PY  - 2015/12
DA  - 2015/12
TI  - Study on Vision based On-machine Micro Tool Measurement Method
BT  - Proceedings of the 2015 Joint International Mechanical, Electronic and Information Technology Conference
PB  - Atlantis Press
SP  - 1076
EP  - 1080
SN  - 2352-538X
UR  - https://doi.org/10.2991/jimet-15.2015.202
DO  - 10.2991/jimet-15.2015.202
ID  - Liu2015/12
ER  -