Proceedings of the 2015 Joint International Mechanical, Electronic and Information Technology Conference

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Research on monocrystalline silicon defect detection based on wavelet singularity

Authors
Wu Wei, Qiu Zongming, Huang Qiu hong
Corresponding Author
Wu Wei
Available Online December 2015.
DOI
10.2991/jimet-15.2015.115How to use a DOI?
Keywords
monocrystalline silicon; defect; wavelet transform; Lipschitz exponent
Abstract

series,the request is too high.The paper constructs a kind of new series instead of the

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 Joint International Mechanical, Electronic and Information Technology Conference
Series
Advances in Computer Science Research
Publication Date
December 2015
ISBN
10.2991/jimet-15.2015.115
ISSN
2352-538X
DOI
10.2991/jimet-15.2015.115How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

risenwbib
TY  - CONF
AU  - Wu Wei
AU  - Qiu Zongming
AU  - Huang Qiu hong
PY  - 2015/12
DA  - 2015/12
TI  - Research on monocrystalline silicon defect detection based on wavelet singularity
BT  - Proceedings of the 2015 Joint International Mechanical, Electronic and Information Technology Conference
PB  - Atlantis Press
SP  - 609
EP  - 619
SN  - 2352-538X
UR  - https://doi.org/10.2991/jimet-15.2015.115
DO  - 10.2991/jimet-15.2015.115
ID  - Wei2015/12
ER  -