Locating theWood Defects with Typical Features and SVM
Zhao Zhang1, Ning Ye, Dongyang Wu, Qiaolin Ye
1NanJing Forestry University
Available Online December 2008.
- 10.2991/jcis.2008.54How to use a DOI?
- SVM; Dual-Tree Complex Wavelet Transform; Local Binary Pattern; Wood Defect Recognition; Texture Analysis
The main purpose of this paper is to present a new wood defect recognition method. Moreover, the results of our proposed method presented here were good or considerably better than the results obtained by the other two methods. The experimental results show our proposed method has better robust to the interferences. Though this technology has made a better recognition result, it is still in further study. At present, it has a certain distance from being applied to the actual production. However, it has perfect theoretical foundation and technology feasibility. Finally, we will receive a better recognition effect, meeting the strict requirements of the l production to a certain extent.
- © 2008, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Zhao Zhang AU - Ning Ye AU - Dongyang Wu AU - Qiaolin Ye PY - 2008/12 DA - 2008/12 TI - Locating theWood Defects with Typical Features and SVM BT - Proceedings of the 11th Joint Conference on Information Sciences (JCIS 2008) PB - Atlantis Press SP - 310 EP - 316 SN - 1951-6851 UR - https://doi.org/10.2991/jcis.2008.54 DO - 10.2991/jcis.2008.54 ID - Zhang2008/12 ER -