Locating theWood Defects with Typical Features and SVM

DOI

10.2991/jcis.2008.54How to use a DOI?

Keywords

SVM; Dual-Tree Complex Wavelet Transform; Local Binary Pattern; Wood Defect Recognition; Texture Analysis

Abstract

The main purpose of this paper is to present a new wood defect recognition method. Moreover, the results of our proposed method presented here were good or considerably better than the results obtained by the other two methods. The experimental results show our proposed method has better robust to the interferences. Though this technology has made a better recognition result, it is still in further study. At present, it has a certain distance from being applied to the actual production. However, it has perfect theoretical foundation and technology feasibility. Finally, we will receive a better recognition effect, meeting the strict requirements of the l production to a certain extent.

Copyright

© 2008, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Zhao Zhang
AU  - Ning Ye
AU  - Dongyang Wu
AU  - Qiaolin Ye
PY  - 2008/12
DA  - 2008/12
TI  - Locating theWood Defects with Typical Features and SVM
BT  - Proceedings of the 11th Joint Conference on Information Sciences (JCIS 2008)
PB  - Atlantis Press
SP  - 310
EP  - 316
SN  - 1951-6851
UR  - https://doi.org/10.2991/jcis.2008.54
DO  - 10.2991/jcis.2008.54
ID  - Zhang2008/12
ER  -