A Novel Integrated Testing Platform Based on Open VPX
- DOI
- 10.2991/itoec-16.2016.59How to use a DOI?
- Keywords
- automatic test; traversal test; integration testing platform (ITP); signal processing system
- Abstract
With the development of high-speed and real-time signal processing systems toward modularization, generalization and reconstruction, a method of modular design has been proposed and accepted widely. However, the increasing module types and extending production scale make the module-test challenged and the test results of modules are dispersed, which make it difficult for collection and post-maintenance. Moreover, it's difficult to perform traversal test with so many module-combinations, and this consumes excess equipments and human resources. In this paper, we proposed a concept of integrated testing, and designed a integrated testing platform (ITP) based on the Open VPX architecture. The ITP can achieve intelligent identification and resources detection of the under-test single/multiple modules after startup, and with the users' manual configurations, the ITP can then perform the traversal test automatically. Besides, the ITP provides functions such as real-time fault alarm and the test report printing. The ITP has been applied in mass testing for an Open VPX-based high-performance processing module, with multiple VLSI (Very Large Scale Integrated) circuits integrated, such as TI TMS320C6678, Xilinx Virtex-6,etc, and greatly increases its efficiency and accuracy.
- Copyright
- © 2016, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Fei Wang AU - Shanqing Hu AU - Xingming Li AU - Jie Wang PY - 2016/05 DA - 2016/05 TI - A Novel Integrated Testing Platform Based on Open VPX BT - Proceedings of the 2nd Information Technology and Mechatronics Engineering Conference (ITOEC 2016) PB - Atlantis Press SP - 311 EP - 318 SN - 2352-5401 UR - https://doi.org/10.2991/itoec-16.2016.59 DO - 10.2991/itoec-16.2016.59 ID - Wang2016/05 ER -