Factory Test Management System Based on Embedded Microprocessor

DOI

10.2991/icpel-17.2017.25How to use a DOI?

Keywords

factory test management system, embedded microprocessor, intelligent instrument, Linux device driver

Abstract

The factory test management system is introduced to reduce the failure rate of intelligent instrument. This paper analyzes the structure of foreign factory test management system. Based on it, this paper introduces the system architecture, testing processes, communications protocols and the software realization of the new factory test management system developed independently, and especially focuses on the design of embedded GUI (MiniGUI) and Linux device drivers. Compared with the foreign factory test system, this factory test management system with 32-bit microprocessor has the advantage of low-cost, small size and strong flexibility.

Copyright

© 2017, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Li Tang
AU  - Li He
AU  - Baosheng Wang
AU  - Shuhua Zhang
PY  - 2017/07
DA  - 2017/07
TI  - Factory Test Management System Based on Embedded Microprocessor
BT  - Proceedings of the 2017 2nd International Conference on Politics, Economics and Law (ICPEL 2017)
PB  - Atlantis Press
SP  - 91
EP  - 94
SN  - 2352-5428
UR  - https://doi.org/10.2991/icpel-17.2017.25
DO  - 10.2991/icpel-17.2017.25
ID  - Tang2017/07
ER  -