Proceedings of the 2017 7th International Conference on Manufacturing Science and Engineering (ICMSE 2017)

Research on ICFD Deep Test Technology Based on LabVIEW Applied to Nuclear Power Station Circuit Board

Authors
Liangcai Qi, Jishi Guan, Xincai Chang
Corresponding Author
Liangcai Qi
Available Online April 2017.
DOI
10.2991/icmse-17.2017.70How to use a DOI?
Keywords
Nuclear Power Station, ICFD, LabVIEW, Fault diagnosis
Abstract

This paper introduces a ICFD (In-Circuit Fault Dignosis) deep test method. According to making test plan of the partial functional module of circuit board, gathering the input and output in-circuit, and assess the performance of the board. This method improves the ICFD technology while it can only test components before. The paper demonstrates the test result of Nuclear Power Station(NPS) board.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2017 7th International Conference on Manufacturing Science and Engineering (ICMSE 2017)
Series
Advances in Engineering Research
Publication Date
April 2017
ISBN
10.2991/icmse-17.2017.70
ISSN
2352-5401
DOI
10.2991/icmse-17.2017.70How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Liangcai Qi
AU  - Jishi Guan
AU  - Xincai Chang
PY  - 2017/04
DA  - 2017/04
TI  - Research on ICFD Deep Test Technology Based on LabVIEW Applied to Nuclear Power Station Circuit Board
BT  - Proceedings of the 2017 7th International Conference on Manufacturing Science and Engineering (ICMSE 2017)
PB  - Atlantis Press
SP  - 372
EP  - 374
SN  - 2352-5401
UR  - https://doi.org/10.2991/icmse-17.2017.70
DO  - 10.2991/icmse-17.2017.70
ID  - Qi2017/04
ER  -