Proceedings of the 2016 4th International Conference on Machinery, Materials and Computing Technology

Analysis about the influence of relays contact resistance for the accuracy of automated resistors

Authors
Panhui Chen, Lifeng Guo, Chuanxi Jin
Corresponding Author
Panhui Chen
Available Online March 2016.
DOI
https://doi.org/10.2991/icmmct-16.2016.111How to use a DOI?
Keywords
automated resistors; relays contact resistance; evaluate the output accuracy.
Abstract
An analysis method about the influence of relays contact resistance for the automated resistors which is based on a measurement of relays nonideal characteristics and two common automated resistor architectures in this paper. It can be used to evaluate the output accuracy theoretically for the automated resistors.
Open Access
This is an open access article distributed under the CC BY-NC license.

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Proceedings
2016 4th International Conference on Machinery, Materials and Computing Technology
Part of series
Advances in Engineering Research
Publication Date
March 2016
ISBN
978-94-6252-165-0
ISSN
2352-5401
DOI
https://doi.org/10.2991/icmmct-16.2016.111How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Panhui Chen
AU  - Lifeng Guo
AU  - Chuanxi Jin
PY  - 2016/03
DA  - 2016/03
TI  - Analysis about the influence of relays contact resistance for the accuracy of automated resistors
BT  - 2016 4th International Conference on Machinery, Materials and Computing Technology
PB  - Atlantis Press
SP  - 552
EP  - 555
SN  - 2352-5401
UR  - https://doi.org/10.2991/icmmct-16.2016.111
DO  - https://doi.org/10.2991/icmmct-16.2016.111
ID  - Chen2016/03
ER  -