Proceedings of the 2016 International Conference on Mechatronics Engineering and Information Technology

Expansion the Output Swing of the Ultra-Low Noise Transimpedance Amplifier for Microcurrent Measurement

Authors
Xueyou Shi, Kai Xie, Bin Sun, Kai Zhao, Anfeng Huang
Corresponding Author
Xueyou Shi
Available Online August 2016.
DOI
10.2991/icmeit-16.2016.43How to use a DOI?
Keywords
microcurrent, low noise amplifier, output swing.
Abstract

Accurate measuring of micro currents in fA range requires an ultra-low bias amplifier which has relative low output swing, limits the value of feedback resistor, and ultimately results a poor noise performances. In this paper, an improved low-noise transimpedance amplifier with a large feedback loop is proposed, so that high-value resistor can be employed to achieve low noise performance. The noise theory, operational principle and circuit implementation are discussed. The prototype is designed with measurement range of 20V/200pA, the test results indicates a low white noise level of 0.5fA/ Hz, and a offset bias of ~2.5fA, while providing an output voltage swing expand to above ±20V.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 International Conference on Mechatronics Engineering and Information Technology
Series
Advances in Engineering Research
Publication Date
August 2016
ISBN
10.2991/icmeit-16.2016.43
ISSN
2352-5401
DOI
10.2991/icmeit-16.2016.43How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Xueyou Shi
AU  - Kai Xie
AU  - Bin Sun
AU  - Kai Zhao
AU  - Anfeng Huang
PY  - 2016/08
DA  - 2016/08
TI  - Expansion the Output Swing of the Ultra-Low Noise Transimpedance Amplifier for Microcurrent Measurement
BT  - Proceedings of the 2016 International Conference on Mechatronics Engineering and Information Technology
PB  - Atlantis Press
SP  - 229
EP  - 232
SN  - 2352-5401
UR  - https://doi.org/10.2991/icmeit-16.2016.43
DO  - 10.2991/icmeit-16.2016.43
ID  - Shi2016/08
ER  -