The Appliance of Duffing Chaotic Detection system in displacement measurement of capacitance sensor
Authors
Xiao Lin, Ya-ping Dai, Xing-xing Hu, Shu-gui Wu
Corresponding Author
Xiao Lin
Available Online July 2015.
- DOI
- 10.2991/icimm-15.2015.243How to use a DOI?
- Keywords
- duffing; chaos detection system; capacitance sensor; weak signal detection
- Abstract
High precision micro displacement measurement framework is fundamental for drilling strain gauges. We try to combine Duffing Chaotic Detection (DCD) method to replace the traditional lock-in amplifier method in drilling strain gauges. Simulation results showed that the DCD method is better than lock-in amplifier method both in the detection accuracy and noise resistance. Even more, the design and realization of DCD method is easier than lock-in amplifier method.
- Copyright
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Xiao Lin AU - Ya-ping Dai AU - Xing-xing Hu AU - Shu-gui Wu PY - 2015/07 DA - 2015/07 TI - The Appliance of Duffing Chaotic Detection system in displacement measurement of capacitance sensor BT - Proceedings of the 5th International Conference on Information Engineering for Mechanics and Materials PB - Atlantis Press SP - 1337 EP - 1342 SN - 2352-5401 UR - https://doi.org/10.2991/icimm-15.2015.243 DO - 10.2991/icimm-15.2015.243 ID - Lin2015/07 ER -