Proceedings of the 2nd International Conference on Computer Science and Electronics Engineering (ICCSEE 2013)

Application of Improved SOM Neural Network in Manufacturing Process Quality Control

Authors
Yibing Li, Fei Pan
Corresponding Author
Yibing Li
Available Online March 2013.
DOI
10.2991/iccsee.2013.290How to use a DOI?
Keywords
Self-organizing Mapping (SOM), artificial neural network, manufacturing process quality control
Abstract

The use of neural networks in quality control has been a popular research topic over the last decade. An adaptive self-organizing mapping (SOM) neural network algorithm is proposed to overcome the shortages of traditional neural networks in this paper. In order to improve the classification effectiveness of SOM neural network, this paper designs an improved SOM neural network, which improved the algorithm formula based on input vector, the number setting of competitive layer neurons and the initializing weight vector. And the method is used to classify the product of cement slide shoe bearing in manufacturing process quality control, and experiment results show that the algorithm adapts well the unsupervised learning problems.

Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference on Computer Science and Electronics Engineering (ICCSEE 2013)
Series
Advances in Intelligent Systems Research
Publication Date
March 2013
ISBN
978-90-78677-61-1
ISSN
1951-6851
DOI
10.2991/iccsee.2013.290How to use a DOI?
Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Yibing Li
AU  - Fei Pan
PY  - 2013/03
DA  - 2013/03
TI  - Application of Improved SOM Neural Network in Manufacturing Process Quality Control
BT  - Proceedings of the 2nd International Conference on Computer Science and Electronics Engineering (ICCSEE 2013)
PB  - Atlantis Press
SP  - 1154
EP  - 1157
SN  - 1951-6851
UR  - https://doi.org/10.2991/iccsee.2013.290
DO  - 10.2991/iccsee.2013.290
ID  - Li2013/03
ER  -