Proceedings of the 2nd International Conference on Computer Science and Electronics Engineering (ICCSEE 2013)

Loose accumulation grain size distribution measurement based on digital image processing technology

Authors
Yong He, Jinxiu Liu
Corresponding Author
Yong He
Available Online March 2013.
DOI
10.2991/iccsee.2013.170How to use a DOI?
Keywords
image processing , supervised classification, loose accumulation, grain size distribution
Abstract

Due to the large range of loose accumulation's grain size, traditional methods almost can not reasonably determine the grain size distribution.In this paper,there is a rapid measurement of its grain size distribution based on digital image processing technology. This method avoids the field sampling and laboratory tests. It cost lowly and fast, has an important significance for project construction.

Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference on Computer Science and Electronics Engineering (ICCSEE 2013)
Series
Advances in Intelligent Systems Research
Publication Date
March 2013
ISBN
10.2991/iccsee.2013.170
ISSN
1951-6851
DOI
10.2991/iccsee.2013.170How to use a DOI?
Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Yong He
AU  - Jinxiu Liu
PY  - 2013/03
DA  - 2013/03
TI  - Loose accumulation grain size distribution measurement based on digital image processing technology
BT  - Proceedings of the 2nd International Conference on Computer Science and Electronics Engineering (ICCSEE 2013)
PB  - Atlantis Press
SP  - 670
EP  - 673
SN  - 1951-6851
UR  - https://doi.org/10.2991/iccsee.2013.170
DO  - 10.2991/iccsee.2013.170
ID  - He2013/03
ER  -