Proceedings of the 6th International Conference on Electronic, Mechanical, Information and Management Society

Design and Analysis of Object-Oriented Embedded Device Detection Method

Authors
Lei Liu, Ting Cai
Corresponding Author
Lei Liu
Available Online April 2016.
DOI
https://doi.org/10.2991/emim-16.2016.78How to use a DOI?
Keywords
Computer application; Embedded; Object-oriented; Default detection
Abstract
With the constant development of high-performance embedded processors, embedded equipment is widely used in various fields, such as military or civilian sector. It has become an urgent problem for manufacturers to guarantee the passing rate of various embedded equipment, but the existing ways to monitor embedded equipment have certain limitations. Improving the reliability of ways to measure embedded equipment can make the detection more efficient, automatic, standardized and easier to be operated. Meanwhile, it is quicker to position defaults to guarantee the test efficiency and comprehensiveness of detection, so there will definitely be wider demand for automatic system, which will have better application prospect. In this paper, the object-oriented thought is combined to design embedded equipment to improve the efficiency of detection and realize various functions of the system.
Open Access
This is an open access article distributed under the CC BY-NC license.

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Proceedings
6th International Conference on Electronic, Mechanical, Information and Management Society
Part of series
Advances in Computer Science Research
Publication Date
April 2016
ISBN
978-94-6252-176-6
ISSN
2352-538X
DOI
https://doi.org/10.2991/emim-16.2016.78How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Lei Liu
AU  - Ting Cai
PY  - 2016/04
DA  - 2016/04
TI  - Design and Analysis of Object-Oriented Embedded Device Detection Method
BT  - 6th International Conference on Electronic, Mechanical, Information and Management Society
PB  - Atlantis Press
SN  - 2352-538X
UR  - https://doi.org/10.2991/emim-16.2016.78
DO  - https://doi.org/10.2991/emim-16.2016.78
ID  - Liu2016/04
ER  -